Problems
What will AGI do for Sub-Nanometer Calibration Failures?
Semiconductor fabs operate lithography and metrology equipment that demands alignment precision down to fractions of a nanometer. Fab engineers and tool operators face constant yield losses when this alignment drifts during high-volume manufacturing. Even microscopic shifts from mechanical vibration, thermal expansion, or electromagnetic interference push the optical pathways out of tolerance, causing overlay errors that ruin entire batches of advanced logic and memory wafers.